Schmidt, Heinz W

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Conference or Workshop Item

Barus, Arlinta, Chen, Tsongyueh, Kuo, Fei-Ching, Liu, Huai ORCID: 0000-0003-3125-4399 and Schmidt, Heinz W (2016) The impact of source test case selection on the effectiveness of metamorphic testing. In: 2016 IEEE/ACM 1st International Workshop on Metamorphic Testing (MET), 16 May 2016-16 May 2016, Austin, Texas, USA.

Liu, Huai ORCID: 0000-0003-3125-4399, Yusuf, Iman I, Schmidt, Heinz W and Chen, Tsongyueh (2014) Metamorphic fault tolerance: An automated and systematic methodology for fault tolerance in the absence of test oracle. In: 36th International Conference on Software Engineering (ICSE Companion 2014), 31 May 2014-07 June 2014, Hyderabad, India.